Most popular articles
Everything About Peaches. Clemson University Cooperative Extension Service Everything About Peaches Website: whether you are a professional or backyard peach...
Mission Statement. For the sake of mankind and the world as a whole a further increase of the sustainability...
Newsletter 9: July 2013 - Temperate Fruits in the Tropics and Subtropics. Download your copy of the Working Group Temperate...
USA Walnut varieties. The Walnut Germplasm Collection of the University of California, Davis (USA). A description of the Collection and a History...
China Walnut varieties.

Articles

Identification of resistance locus and characterization of effector genes toward breeding for resistance to Phytophthora infestans

Article number
1316_2
Pages
9 – 14
Language
English
Abstract
Late blight disease, caused by Phytophthora infestans (Mont.) de Bary, is a serious disease in tomato and potato all over the world.
To overcome this disease by a breeding strategy, resistance genes or their genetic loci should be identified.
In addition, since P. infestans isolates have great genetic variability and environmental adaptability, assessment of the genetic variability of the effector genes is helpful to design breeding programs.
Here, we report a new disease resistance locus through a genome-wide association study in which an aggressive P. infestans isolate and a robust sequencing technology were employed for phenotyping and genotyping of an interspecific mapping population of tomato.
In addition, non-synonymous mutations in the P. infestans effector genes were identified.
Genome information on both the host plant and the pathogen is helpful to resistance breeding programs in tomato and potato for managing late blight.

Publication
Authors
R.A. Arafa, M.T. Rakha, S.M. Kamel, N.E.K. Soliman, O.M. Moussa, K. Shirasawa
Keywords
double-digest restriction-site associated DNA sequencing, effector genes, genome-wide association study, Phytophthora infestans, tomato
Full text
Online Articles (20)
M.C. Cho | S.Y. Lee | E.Y. Yang | C.W. Nam | J.H. Moon | S.Y. Chae | J.H. Kim
D.W. Barchenger | J.Y. Ou | Y.C. Lin | Y.C. Hsu | S.F. Lu | J.R. Chen | L. Kenyon | P. Hanson
S.-T. Wang | S.-Y. Hsu | T.-Y. Yeh | S.-H. Hseu
Y.Y. Liao | A. Strayer-Scherer | S. Santra | J.B. Jones | M.L. Paret
B. Avni | D. Gelbart | T. Sufrin-Ringwald | A. Zinger | L. Chen | Z. Machbash | I. Bekelman | M. Segoli | A. Dombrovsky | R. Kamenetsky | I. Levin | M. Lapidot
T.P. Martins | C.M. Rego | E.Y.T. Nakasu | F.R. Fernandes | A.K. Inoue-Nagata
L. Kenyon | Y.L. Chan | L.M. Lee | F.H. Kuo | S.L. Shih
R. Achari | K.T. Rangaswamy | N. Nagaraju | H.A. Prameela | K.S. Jagadish | K. Govin | B. Karkale | K.S. Shankarappa | G.K. Ramegowda | T.S. Rathod | D.R. Babu | M. Lanting
W.Y. Chen | S.L. Shih | M.H. Hsieh | L. Kenyon