LEAF DAMAGE RISK ASSESSMENT OF AECHMEA USING LEAF SAP ELECTRICAL CONDUCTIVITY VALUES

The commercial horticultural trade of ornamental bromeliads still has a large growth potential.
Though, leaf quality problems still hinder part of this expansion.
One well documented problem is the occurrence of necrotic spots in the foliage of Aechmea plants.
This specific type of leaf damage occurs mostly at the leaf bend, with run outs to the leaf top.
In this study, a leaf damage risk assessment of a sensitive Aechmea hybrid using leaf sap electrical conductivity (EC) values was done.
A good correlation between risk and EC values was revealed.
Moreover, a critical leaf sap EC value could be defined namely 0.9 µS.cm^-1.mgFW^-1. Below this value, the risk on leaf damage was proven to be negligible.
Higher leaf sap EC values correlated with higher (mostly lethal) turgor pressures, thought to be the main cause of this type of leaf damage.
Diurnal leaf sap EC values were clearly higher in the morning.

International Conference on Quality Management in Supply Chains of Ornamentals

E. Londers, J. Ceusters, M.P. De Proft

Bromeliaceae, leaf quality, turgor pressure, crassulacean acid metabolism, malic acid

https://doi.org/10.17660/ActaHortic.2007.755.72