Articles
A SCANNING ELECTRON MICROSCOPY SURVEY OF POLLEN GRAINS OF SOUR CHERRY CULTIVARS
Article number
410_20
Pages
133 – 136
Language
Abstract
Pollen grains of four sour cherry cultivars were examined in 1990 and 1992 using scanning electron microscopy.
Two varieties were tested also by analytical electron microscopy.
Examination of the morphological characteristics of the pollen surface revealed the surface structure of varieties to be different.
Ridge characteristics and number and size of pits can be used to distinguish between cultivars.
Two varieties were tested also by analytical electron microscopy.
Examination of the morphological characteristics of the pollen surface revealed the surface structure of varieties to be different.
Ridge characteristics and number and size of pits can be used to distinguish between cultivars.
Publication
Authors
J. Nyéki, P. Sótonyi, Z. Szabó, E. Felhosné Váczi, F. Csillag
Keywords
Online Articles (92)
